Thermal test enclosures allow accurate testing of products

Available in clamshell or hood configurations

The Thermal test enclosures are available for the ThermoJet ES precision temperature cycling system

SP Scientific’s thermal test enclosures for its ThermoJet ES precision temperature cycling system have been developed with Khoury Industries of Bellingham, MA, US and provide accurate testing and processing of temperature-sensitive electronic products.

Available in either clamshell or hood configurations, the enclosures may be used to isolate a device under test (DUT) at a precise temperature insulated from external conditions, thereby providing the optimal conditions for highly accurate testing.

Maintaining a uniform stable temperature with real-time thermal measurements on a device under test, the new enclosures deliver unmatched test accuracy and precision, the firm says. They allow temperature testing of a variety of device sizes into almost any test set-up, enabling characterisation, qualification, and fault isolation on components or production level testing.

All thermal test enclosures are electrostatic discharge (ESD)-free and/or electromagnetic interference (EMI) shielded.

Fully compliant with CE Standards, the ThermoJet ES offers a host of features, including enhanced data logging capabilities that allow the system to be used for device characterisation through advanced trending and data analysis. The system also allows easy data transfer to a PC using a USB memory stick.

When partnered with the ThermoJet ES, the thermal enclosures provide engineers and researchers with an accurate, productive, and flexible tool for thermal testing or temperature cycling of a wide range of electronic components, wafers, hybrids, IC's and other devices at precisely controlled temperatures.

The ThermoJet ES and thermal enclosure combination also provides testing of larger components and DUTs to help increase throughput and productivity, with temperatures ranging from –80°C to +225°C.

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